name: SOI220nm_1550nm_TE_Defect_Detector
component_type: Photodiode
authors:
- name: H Bilge Yagci
  organisation: CORNERSTONE
  email: hby1r25@soton.ac.uk
last_updated: 28/07/2025
modes:
- mode_numbers:
  - 0
  - 0
  polarisation: TE
  wavelength: 1550
ports:
- name: e1
  port_type: electrical_rf
  center:
  - 542
  - -92.5
  orientation: 270
  cross_section: detector
- name: e2
  port_type: electrical_rf
  center:
  - 692
  - -92.5
  orientation: 270
  cross_section: detector
- name: vertical_te_w
  port_type: vertical_te
  center:
  - 27.915
  - 50
  orientation: 180
  width: 10
  coupling_angle_cladding: 6.886
  fibre_modes:
  - fibre_type: SMF-28
    wavelength: 1550.0
- name: vertical_te1_e
  port_type: vertical_te
  center:
  - 2766.084
  - 50
  orientation: 0
  width: 10
  coupling_angle_cladding: 6.886
  fibre_modes:
  - fibre_type: SMF-28
    wavelength: 1550.0
ancestors:
- name: SOI220nm_1550nm_TE_IsolatedDetector
  commit: ReferenceWithinCommit
- name: SOI220nm_1550nm_TE_RIB_Grating_Coupler
  commit: ReferenceWithinCommit

